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Rutherford backscattering spectroscopy
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Everything about Rutherford Backscattering totally explained

Rutherford backscattering spectroscopy (RBS) is an analytical techniqueused in materials science. Sometimes referred to as high-energy ion scattering (HEIS) spectroscopy, RBS is used to determine the structure and composition of materials by measuring the backscattering of a beam of high energy ions impinging on a sample.

The Geiger-Marsden experiment

Rutherford backscattering spectroscopy is named for Lord Ernest Rutherford, a physicist sometimes referred to as the father of nuclear physics. Rutherford supervised a series of experiments carried out by Hans Geiger and Ernest Marsden between 1909 and 1914 studying the scattering of alpha particles through metal foils. While attempting to eliminate "stray particles" they believed to be caused by an imperfection in their alpha source, Rutherford suggested that Marsden attempt to measure backscattering from a gold foil sample. According to the then-dominant plum-pudding model of the atom, in which small negative electrons were spread through a diffuse positive region, backscattering of the high-energy positive alpha particles should have been nonexistent. At most small deflections should occur as the alpha particles passed almost unhindered through the foil. Instead, when Marsden positioned the detector on the same side of the foil as the alpha particle source, he immediately detected a noticeable backscattered signal. According to Rutherford, "It was quite the most incredible event that has ever happened to me in my life. It was almost as incredible as if you fired a 15-inch shell at a piece of tissue paper and it came back and hit you."
   Rutherford interpreted the result of the Geiger-Marsden experiment as an indication of a collision with a single massive positive particle. This led him to the conclusion that the atom's positive charge couldn't be diffuse but instead must be concentrated in a single massive core: the atomic nucleus. Calculations indicated that the charge necessary to accomplish this deflection was approximately 100 times the charge of the electron, close to the atomic number of gold. This led to the development of the Rutherford model of the atom in which a positive nucleus made up of Ne positive particles, or protons, was surrounded by N orbiting electrons of charge e to balance the nuclear charge. This model was eventually superseded by the Bohr atom, incorporating some early results from quantum mechanics.

Basic principles

In the first approximation we can describe Rutherford backscattering as an elastic hard-sphere collision between a high kinetic energy particle from the incident beam and a stationary particle located in the sample. Assuming conservation of momentum and kinetic energy, we can write the energy E_1 of the scattered projectile as » :E_1 = E_0 left(frac

While the intensity of an RBS peak is observed to decrease across most of its width when the beam is channeled, a narrow peak at the high-energy end of larger peak will often be observed, representing surface scattering from the first layer of atoms. The presence of this peak opens the possibility of surface sensitivity for RBS measurements.

Surface sensitivity

While RBS is generally used to measure the bulk composition and structure of a sample, it's possibile to obtain some information about the structure and composition of the sample surface. When the signal is channeled to remove the bulk signal, careful manipulation of the incident and detection angles can be used to determine the relative positions of the first few layers of atoms, taking advantage of blocking effects.
   The surface structure of a sample can be changed from the ideal in a number of ways. The first layer of atoms can change its distance from subsequent layers (relaxation); it can assume a different two-dimensional structure than the bulk (reconstruction); or another material can be adsorbed onto the surface. Each of these cases can be detected by RBS. For example, surface reconstruction can be detected by aligning the beam in such a way that channeling should occur, so that only a surface peak of known intensity should be detected. A higher-than-usual intensity or a wider peak will indicate that the first layers of atoms are failing to block the layers beneath, for example that the surface has been reconstructed. Relaxations can be detected by a similar procedure with the sample tilted so the ion beam is incident at an angle selected so that first-layer atoms should block backscattering at a diagonal; that is, from atoms which are below and displaced from the blocking atom. A higher-than-expected backscattered yield will indicate that the first layer has been displaced relative to the second layer, or relaxed. Adsorbate materials will be detected by their different composition, changing the position of the surface peak relative to the expected position.
   RBS has also been used to measure processes which affect the surface differently than the bulk by analyzing changes in the channeled surface peak. A well-known example of this is the RBS analysis of the premelting of lead surfaces by Frenken, Maree and van der Veen. In an RBS measurement of the Pb(110) surface, a well-defined surface peak which is stable at low temperatures was found to become wider and more intense as temperature increase past two-thirds of the bulk melting temperature. The peak reached the bulk height and width as temperature reached the melting temperature. This increase in the disorder of the surface, making deeper atoms visible to the incident beam, was interpreted as pre-melting of the surface, and computer simulations of the RBS process produced similar results when compared with theoretical pre-melting predictions.
   RBS has also been combined with nuclear microscopy, in which a focused ion beam is scanned across a surface in a manner similar to a scanning electron microscope. The energetic analysis of backscattered signals in this kind of application provides compositional information about the surface, while the microprobe itself can be used to examine features such as periodic surface structures.

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